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Conference Title 2025 4th International Conference on Machine Vision, Automatic Identification and Detection
Conference Dates May 23-25 , 2025
Submission Deadline 2025-05-16
Indexes EI-compendex , SCOPUS
Official Web Site MVAID 2025
Venue 武汉东湖学院
Location Wuhan , China
Description It is our utmost pleasure to extend an invitation for your esteemed presence at the 4th International Conference on Machine Vision, Automatic Identification and Detection (MVAID 2025), scheduled to take place in Wuhan, China from May 23-25, 2025. MVAID 2025 aims to foster a dynamic platform for global scholars and engineers engaged in the cutting-edge domains of Machine Vision, Automatic Identification and Detection.

The forefront of the global STI mega-trend witnesses China's continuous efforts in establishing an increasingly open environment for science, technology, and innovation (STI), fostering extensive academic collaborations, and nurturing a vibrant innovation community that benefits all stakeholders. These endeavors not only contribute to globalization but also facilitate the creation of a shared future community.

The MVAID conference, held annually, aims to convene professors, researchers, scholars, and industrial pioneers from around the globe. MVAID serves as the foremost platform for presenting and exchanging past experiences, new advances, and research findings in both theoretical and industrial realms. The conference warmly welcomes contributions that foster idea exchange and rational discourse among educators and researchers worldwide. The organizing committee of the conference is delighted to extend an invitation to prospective authors for submitting their original manuscripts to MVAID 2025.
The topics of interest for submission include, but are not limited to:

◕ Machine Vision
· Optical imaging
· Image capture
· Light source system
· Digital Image Processing
· Sensor
· Active Vision
· 3D-Vision
· Artificial Intelligence
· Image Processing
· Image Processing Methods
· Computational Imaging
· Machine Vision Systems and Components

◕ Automatic Identification and Detection Technology
· Artificial Intelligence Techniques in Automatic Identification
· Biometrics (including face recognition)
· Document Processing and Recognition
· Advanced Learning Methods
· Linear Models and Dimensionality Reduction
· Natural Language Processing and Recognition
· Face and gesture recognition
· Pattern recognition
· Image Forensics and Identification
· Microcomputer Measurement and Control Device and System
· Sensor Technique & Application
· Automatic Detection and Conversion Technology
· Research and Application of Detection Technology and Automation Device
· Control, Operation and Maintenance of Automatic Detection System

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